XRF / N90

The X-ray fluorescence analysis (XRF) is a non-destructive analytical method used to determine the chemical composition of materials. In this process, the atoms of a material are irradiated with X-rays, causing the atoms to emit characteristic fluorescence radiation. This emitted radiation is specific to each element and can be measured to identify the individual elements in the material and determine their concentrations.

Key advantages:

• Non-destructive
• Fast analysis
• Suitable for solid, liquid, and powdered samples

Applications:

• Material sciences
• Geology
• Archaeology
• Environmental analysis

XRF is particularly useful for analyzing metals, alloys, minerals, and plastics.